Vertical Scan 3D Microscopy Vision Module

Following the debut of the V8020D prototype in 2025, BENANO received strong interest and extensive evaluation requests from customers worldwide. The V8020D officially entered commercial production in Q3 2026.

Featuring a 21 MP ultra-large field of view, high-speed imaging, and an integrated 3-in-1 microscopic 3D imaging architecture, the V8020D provides exceptional flexibility for a wide range of inspection tasks. Users can select the most suitable imaging technology according to different surface materials and geometries, ensuring optimal inspection performance across diverse applications.

The V8020D is the ideal optical inspection head for advanced semiconductor applications, particularly for Micro Bump inspection and heterogeneous material inspection in Co-Packaged Optics (CPO), where high precision, speed, and imaging versatility are essential.

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